Portable EL detector, this is how you use it!

EL image analysis technology is a non-destructive testing method that provides intuitive information about the internal microstructure of solar cells, helping manufacturers and technicians to identify and solve production process issues in a timely manner, thereby improving the overall performance and service life of solar cells.

A Portable EL detector utilizes this technology by applying a certain range of forward current to the solar cell, using the principle of electroluminescence (EL) to detect internal defects of the cell. In this test, the cell is excited to emit light, the brightness of which is proportional to the diffusion length of electrons within the cell and also to the current density. By analyzing the EL images of the cell, internal defects such as cracks and fractures can be effectively identified.

Usage of Portable EL detector:

It is used to detect issues such as hidden cracks and black spots in solar modules.

During the construction of photovoltaic power stations with complex terrains, the transportation and installation of modules can easily lead to hidden cracks. Using an EL tester can quickly inspect and discover these issues, ensuring the quality of the power station.

It helps in experiments by identifying and eliminating hidden cracks in modules first, making degradation test results more accurate.

When solar modules are damaged by natural disasters, such as being blown over by strong winds, the detection conducted with an EL detector can serve as the basis for insurance claims. Insurance companies usually accept such professional test results, helping power station owners to obtain more compensation and thus reduce losses.

The above are the main uses of the Portable EL detector. Fengtu, as a distributor and agent of EL detectors, offers a variety of EL testing instruments, including Drone Photovoltaic Inspection, Portable photovoltaic test darkroom, EL Test Power Supply, and other products, all at competitive prices, and welcomes inquiries.